Description:
Benchtop spectrophotometer Xrite Ci7500
Technical Specifications:
- Tri-Beam measurement with Pulsed Xenon D65 calibrated light source and 2D CCD array/holographic grating.
- Measurement cycle time ≈2.5 sec
- Spectral range 360 - 750 nm in 10 nm or 20nm wavelength intervals.
- Optical configuration diffuse 8° with 152mm sphere.
- Simultaneous SCI/SCE measurement.
- Control Panel for specular port and UV Filter control, Buttons for activating preview, standard and trial measurement directly from the instrument.
- Adjustable of Cut-off UV light component through software.
- Automatic lens positioning according to the selected measurement aperture.
- Special shock absorbance system on the measurement holder to avoid damaging measurement aperture.
- Repeatability ≤ 0.03 RMS, dE CIELAB.
- Interinstrument Agreement (LAV) (ΙΙΑ): 0.15 avg ΔΕ CIELAB
- Reflectance measurement apertures at two different sizes:
Large Area View 25 mm (LAV)
Small Area View 10 mm (SAV)
- Inter Aperture agreement (ΙΑΑ).
- Photometric Range 0% - 200%.
- Photometric Resolution 0.01% reflectance
- Integrated Temperature and Humidity sensors.
- Sample Video Preview
- Interface USB 2.0
- NetProfiler instrument embedded.
- Horizontal Measurement Plane – Vertical instrument position (Optional kit)
- Electrical requirements 100-240 Volt AC / 50-60 Hz.
