Description:
Laboratory Reference Spectrophotometer Xrite Ci7800/Ci7830
Technical Specifications:
High precision and accuracy measurement with the following technical data:
- Tri-Beam measurement with Pulsed Xenon D65 calibrated light source and 2D CCD array/holographic grating.
- Measurement cycle time ≈2.5 sec
- Spectral range 360 - 780 nm in 5nm, 10 nm or 20nm wavelength intervals.
- Optical configuration diffuse 8° with 152mm sphere.
- Simultaneous SCI/SCE measurement.
- Control Panel for specular port and UV Filter control, Buttons for activating preview, standard and trial measurement directly from the instrument.
- Adjustable of Cut-off UV light component through software.
- Three UV filters:
400nm (Standard)
420nm (Optional)
460nm (Optional)
- Automatic lens positioning according to the selected measurement aperture.
- Special shock absorbance system on the measurement holder to avoid damaging measurement aperture.
- Repeatability ≤ 0.01 RMS, dE CIELAB.
- Interinstrument Agreement (LAV) (ΙΙΑ): 0.08 avg ΔΕ CIELAB
- Reflectance measurement apertures at five different sizes:
Large Area View 25 mm (LAV)
Medium Area View 17 mm (MAV)
Small Area View 10 mm (SAV)
Very Area View 6 mm (VSAV)
Ultra Small Area View 3.5 mm (USAV) (Optional)
- Transmission measurement – (Optional kit). Only in Ci7800
- Transmission measurement apertures at three different sizes – (Optional kit): Only in Ci7800
Large Area View 22 mm (LAV)
Medium Area View 17mm (MAV)
Small Area View 10 mm (SAV)
Very Area View 6 mm (VSAV)
- Laser Targeting of measurement area in transmission mode. Only in Ci7800
- Inter Aperture agreement (ΙΑΑ).
- Photometric Range 0% - 200%.
- Photometric Resolution 0.01% reflectance
- Integrated Temperature and Humidity sensors.
- Sample Video Preview
- Interface USB 2.0
- NetProfiler instrument embedded.
- Horizontal Measurement Plane – Vertical instrument position (Optional kit)
- Electrical requirements 100-240 Volt AC / 50-60 Hz.
